Determination of impurities in silica sol for polishing solution in semiconductor industry—Inductively coupled plasma atomic emission spectrometric method
基本信息
标准号:
JC/T 2133-2012
名称:
半导体抛光液用硅溶胶中杂质元素含量的测定 电感耦合等离子体原子发射光谱法
英文名称:
Determination of impurities in silica sol for polishing solution in semiconductor industry—Inductively coupled plasma atomic emission spectrometric method